Thermal Emission Scanning Electron Microscope – IQScan W32

  • Modern Design of Electronic Column;
  • Improved performance at low accelerating voltages. Resolution of 7 nm at 3 kv;
  • simplified procedure for replacing the cathode and a built-in software wizard for adjusting the electron column;
  • Optical Navigation Camera as Standard;
  • Safe Table Movement System, built-in collision system;
  • astigmatism compensation mode using artificial intelligence. Unique Mode for Assisted Stigmator Adjustment;
  • Low Vacuum Mode (Optional). for working with non-conductive samples without additional sample preparation;
  • Many additional options to expand the capability.
Permission 3 nm – 30 kV (SE) | 7 nm – 3 kV (SE) | 4 nm – 30 kV (BSE)
Increase 12x – 300000x
cathode type Thermionic Tungsten Cathode
Accelerating Voltage 200V – 30KV
Vacuum System Turbomolecular Pump, Rotary Pump
detectors SE, Semiconductor four-section BSE
table With Five Degrees of Freedom
Table Travel Range X,Y: 125 mm | Z: 50 mm | R: 360° | T: -10° – 90°
Maximum sample diameter 270 mm
Additional options EDS, CL, EBL, Airlock, Heating and Cooling Stage, Physical and Mechanical Testing Stage, etc.

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