Scanning electron microscope with field emission – IQSCAN F40

  • High resolution makes it easy to operate on a submicron scale
  • Shottky cathode provides a stable and bright electronic beam for long-term shooting and analytics
  • Convenient interface. Autofocus support: autofocus, automatic brightness and contrast, automatic astigmatism correction
  • Rich in functionality to expand functionality by installing additional options and detectors such as STEM, EDS, EBSD, etc.
  • Low vacuum mode as standard
  • Additional Options for Particle and Pore Analysis Software: Quantitative Analysis of Particle and Pore Statistics
Resolution 0.9 Nm – 30kV (SE) | 1 Nm – 15 kV (SE) | 1.8 Nm – 1 kV (SE)
Increase 12x – 1,000,000x
Cathode type Schottky cathode
accelerating voltage 200 V – 30 kV
Detectors SE, LVD, semiconductor four-section BSE
Platen With five degrees of freedom
Table movement range X,Y: 110mm | Z: 65 mm | R: 360° | T: -10° – 70°
Additional options EDS, EBSD, CL, STEM, Gateway, table with heating and cooling, table for physical and mechanical testing, etc.

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