Ultra-high resolution scanning electron microscope – IQScan F50

Ultra-high resolution: 0.6 Nm at 15 kV and 1 Nm at 1 sq. High image quality at low accelerating voltages
SuperTunnel™ technology: Provides low aberration and high beam stability, improving image quality
Electron-optical path without crossover: reduces aberration and increases resolution, especially at low voltages
Water-cooled lens: maintains constant temperature, ensuring stability of work
Wide range of available electron energies: from 20 eV to 30 keV, allows you to study different types of samples without additional sample preparation
Rich in functionality to expand functionality by installing additional options and detectors such as STEM, EDS, EBSD, etc.
Convenience: Intuitive Interface and Optical Navigation on the Model Simplify the study process

Resolution	0.7 Nm – 15 kV (SE) \| 1.1 Nm – 1 kV (SE)
Increase	12x – 2 500 000X
Cathode type	Schottky cathode
accelerating voltage	20 V – 30 kV
Detectors	SE, IN-LENS, semiconductor four-section BSE
Platen	With five degrees of freedom
Table movement range	X,Y: 110mm \| Z: 65 mm \| R: 360° \| T: -10° – 70°
Additional options	EDS, EBSD, CL, STEM, Gateway, table with heating and cooling, table for physical and mechanical testing, etc.

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